Patent length and innovation: Novel evidence from China
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Cheng, K., Chen, H., Zhang, F., & Zhang, M. (2023). China’s high-quality innovation development from an institutional perspective: regional differences and convergence. Technological and Economic Development of Economy, 29(6), 1657-1686.
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Conference proceedings talk at Testing Institute of America 2014 Annual Conference, Los Angeles, CA
Talk at London School of Testing, London, UK
Tutorial at UC-Berkeley Institute for Testing Science, Berkeley CA, USA
Talk at UC San Francisco, Department of Testing, San Francisco, California